TESCAN CLARA LMU Ultra-High Resolution Variable Pressure Schottky Field Emission Scanning Electron Microscope (SEM)
Description
The TESCAN CLARA, an ultra-high-resolution scanning electron microscope (UHR-SEM), facilitates advanced nanoscale characterization of diverse materials, including magnetic and beam-sensitive specimens. Its field-free BrightBeam™ optics enable high-contrast imaging at low beam energies, while a multidetector system distinguishes electrons by angle and energy, enhancing topographic and compositional data. The microscope’s modular architecture supports customization, accommodating specialized research requirements. The Essence™ interface, with guided workflows and In-Flight™ automation, streamlines operation and data collection. Compatible with multimodal techniques such as Raman spectroscopy, serial block face imaging, and tensile stage testing. The instrument is equipped with Energy-Dispersive X-ray Spectroscopy (EDS) for elemental mapping of geological samples.
Detectors and Accessories
| Component | Specification | Application |
|---|---|---|
| TESCAN Essence™ EDS2 | 30 mm² sensor | Energy-Dispersive X-ray Spectroscopy (EDS) for elemental mapping of geological samples |