Scientific Instrumentation
  • Home
  • Meta-Categories
    • NIST-2024
    • Chromatography
    • Data Loggers
    • Imaging
    • Microscopy
    • Spectroscopy
    • Unmanned Vehicle Systems (UVS)
    • Other
  • Instruments
    • Agilent ICP-MS 7850
    • Blue Robotics BlueROV2
    • GOWMAC 400
    • Instron 34SC-1
    • Leica M205 FCA Microscope
    • Molecular Devices SpectraMax iD3 Microplate Reader
    • PerkinElmer FI-IR Spectrum Two
    • PerkinElmer FT-IR Microscopy System Spotlight 200 with Spectrum Two
    • TESCAN CLARA SEM
    • YSI EXO1 Sonde
  • Logbooks
    • Index
    • Disaster Recovery
  • Source Code
  • Submit ticket

Contents

  • Description
  • Technical Details
  • Manuals
    • (SOP) Standard Operating Procedure
  • Instrument Table

TESCAN CLARA LMU Ultra-High Resolution Variable Pressure Schottky Field Emission Scanning Electron Microscope (SEM)

with Quorum - PP3010 Cryo-SEM Preparation System

Published

May 16, 2025

Description

The TESCAN CLARA, an ultra-high-resolution scanning electron microscope (UHR-SEM), facilitates advanced nanoscale characterization of diverse materials, including magnetic and beam-sensitive specimens. Its field-free BrightBeam™ optics enable high-contrast imaging at low beam energies, while a multidetector system distinguishes electrons by angle and energy, enhancing topographic and compositional data. The microscope’s modular architecture supports customization, accommodating specialized research requirements. The Essence™ interface, with guided workflows and In-Flight™ automation, streamlines operation and data collection. Compatible with multimodal techniques such as Raman spectroscopy, serial block face imaging, and tensile stage testing.

Technical Details

TESCAN CLARA Data Sheet

Manuals

TESCAN CLARA User Manual

(SOP) Standard Operating Procedure

Instrument Table

SI-Table-TESCAN-CLARA-SEM